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2520
Κωδικός προϊόντος: 2520
Κατασκευαστής: Tektronix/ Keithley Διαθέσιμο
ARB & Pulse Generator, Puled Laser Diode Test System w/ Remote Test Head: - Simplifies Laser Diode LIV Testing Prior to Packaging or Active Temperature Control
- Integrated Solution for in-process LIV Production Testing of Laser Diodes at the Chip or Bar Level
- Combines High Accuracy Source & Measure Capabilities for Pulsed & DC Testing
- Synchronized DSP Based Measurement Channels Ensure Highly Accurate Light Intensity & Voltage Measurements
- Programmable Pulse on Time from 500ns to 5ms up to 4% Duty Cycle
- Pulse Capability up to 5A
- DC Capability up to 1A
- 14-bit Measurement Accuracy on 3 Measurement Channels (VF, Front Photodiode, Back Photodiode)
- Digital I/O Binning & Handling Operations
- IEEE-488 & RS-232 Interfaces
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Διαθέσιμο
ARB & Pulse Generator, Puled Laser Diode Test System w/ Remote Test Head:
- Simplifies Laser Diode LIV Testing Prior to Packaging or Active Temperature Control
- Integrated Solution for in-process LIV Production Testing of Laser Diodes at the Chip or Bar Level
- Combines High Accuracy Source & Measure Capabilities for Pulsed & DC Testing
- Synchronized DSP Based Measurement Channels Ensure Highly Accurate Light Intensity & Voltage Measurements
- Programmable Pulse on Time from 500ns to 5ms up to 4% Duty Cycle
- Pulse Capability up to 5A
- DC Capability up to 1A
- 14-bit Measurement Accuracy on 3 Measurement Channels (VF, Front Photodiode, Back Photodiode)
- Digital I/O Binning & Handling Operations
- IEEE-488 & RS-232 Interfaces
Στείλτε μια ερώτηση για το προϊόν
Performance Benchmarking Solution
Κωδικός: Performance Benchmarking Solution
